Inheritance of race 1.2 Fusarium wilt resistance in four melon cultivars |
| |
| Authors: | Hela Chikh-Rouhou Rafael González-Torres Ali Oumouloud and José M Alvarez |
| |
| Institution: | (1) Institut Superieur Agronomique – Chott Mariem Institut, 4042 Sousse, Tunisia;(2) Centro de Investigaci?n y Tecnolog?a Agroalimentaria (CITA), Avda. de Monta?ana 930, 50059 Zaragoza, Spain;(3) Institut Agronomique et V?t?rinaire Hassan II, Complexe Horticole d’Agadir, BP 18/S, 80000 Agadir, Morocco; |
| |
| Abstract: | The resistance to Fusarium oxysporum f.sp. melonis (Fom) race 1.2 has been studied in melons, such as the Portuguese accession ‘BG-5384’ and in the Japanese ‘Shiro Uri Okayama’,
‘Kogane Nashi Makuwa’, and ‘C-211’, since a good characterization of the resistance is necessary before its introgression
into commercial varieties. These four melon accessions showed a high level of resistance to races 0, 1, and 2 of Fom, indicating that the partial resistance to the race 1.2 previously detected may not have been race specific. To determine
the mode of inheritance of the resistance to Fom race 1.2, the F1, F2, BCPR, and BCPS generations from the crosses between the four resistant accessions above and ‘Piel de Sapo’, a Fom race 1.2 susceptible melon, were developed. They were subsequently inoculated with two Fom isolates, one from the pathotype 1.2Y and the other from the pathotype 1.2W. The area under the disease progress curve was
determined for each inoculated plant, and the data were analyzed. We show that the resistance seen in these accessions is
polygenically inherited with a complex genetic control because many epistatic interactions were detected. The three epistatic
effects; additivity × additivity, dominance × dominance, and dominance × additivity are present and significant, with differing
magnitudes from one cross to the next. The relatively low heritabilities, and these epistatic effects make difficult the improvement
of the resistance, from these sources, through a standard selection procedure. |
| |
| Keywords: | |
| 本文献已被 SpringerLink 等数据库收录！ |
|
