Molecular cytogenetic identification of wheat-Elymus tsukushiense introgression lines |
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| Authors: | SL Wang LL Qi PD Chen DJ Liu B Friebe BS Gill |
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| Institution: | (1) Cytogenetics Laboratory, Nanjing Agricultural University, Nanjing Jiangsu, 210095 P.R. of, China;(2) Department of Plant Pathology, Kansas State University, Manhattan, 66506–5502, U.S.A |
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| Abstract: | Elymus tsukushiense Honda (syn. Roegneria kamoji C. Koch) (2n = 6x = 42, StsStsHtsHtsYtsYts) is a hexaploid species, distantly related to bread wheat Triticum aestivum L. em Thell (2n = 6x = 42, AABBDD). Apart from
the delineation of evolutionary relationships, this species is a potential source of resistance to scab, a devastating disease
of wheat caused by Fusarium graminearum Schw. A standard C-banded karyotype was established identifying all 21 chromosome
pairs of E. tsukushiense. By using C-banding and genomic in situ hybridization analyses, three wheat-E. tsukushiense chromosome
addition lines, one ditelosomic addition line, and one disomic substitution line were identified in BC2 progenies from wheat × E. tsukushiense hybrids. Twenty DNA markers specific for the seven homoeologous groups of the Triticeae
were used to determine the homoeology of the added E. tsukushiense chromosomes. The E. tsukushiense chromosomes in the addition
lines NAU702, NAU703, and NAU701 were identified as belonging to homoeologous groups 1, 3, and 5, and thus, were designated
as 1Ets#1, 3Ets#1, and 5Ets#1, respectively. NAU751 was identified as a disomic substitution line with chromosome 3A of wheat
replaced by chromosome 3Ets#1. Line NAU702 has a high level of resistance to scab and will be used in chromosomal engineering
and development of improved wheat germplasm for scab resistance breeding.
This revised version was published online in July 2006 with corrections to the Cover Date. |
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| Keywords: | C-banding chromosome additions chromosome substitution Elymus tsukushiense homoeology in situ hybridization RFLP Roegneria kamoji Triticum aestivum |
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